专利内容由知识产权出版社提供
专利名称：Method and apparatus for generating
components for pattern-based systemdesign analysis using a characteristics model
发明人：Syed M. Ali,Yury Kamen,Deepak Alur,John P.
Crupi,Daniel B. Malks
申请号：US11133717申请日：20050520公开号：US07660802B2公开日：20100209
专利附图：
摘要：A method for analyzing a target system that includes obtaining a characteristics
model, generating at least one selected from the group consisting of a schema,characteristics store API, and a characteristics extractor, using the characteristics model,obtaining a plurality of characteristics from the target system using characteristicsextractor, wherein each of the plurality of characteristics is associated with the
characteristics model, storing each of the plurality of characteristics in the characteristicsstore using the schema, and analyzing the target system by issuing at least one query tothe characteristics store to obtain an analysis result.
申请人：Syed M. Ali,Yury Kamen,Deepak Alur,John P. Crupi,Daniel B. Malks
地址：Menlo Park CA US,Menlo Park CA US,Fremont CA US,Bethesda MD US,ArlingtonVA US
国籍：US,US,US,US,US
代理机构：Osha • Liang LLP
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