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专利名称：Transmission characteristics measurement
apparatus, transmission characteristicsmeasurement method, and electronic device
发明人：Masahiro Ishida,Kenichi Nagatani申请号：US12413604申请日：20090330公开号：US08140290B2公开日：20120320
专利附图：
摘要：Provided is a transfer characteristic measurement apparatus that measures atransfer characteristic of a circuit under test between input and output, comprising a test
signal input section that generates a test signal by adding together a carrier signal havinga prescribed frequency and an additional signal having a frequency that differs from theprescribed frequency, and inputs the test signal to the circuit under test; and a transfercharacteristic measuring section that measures the transfer characteristic of the circuitunder test at the frequency of the additional signal based on a result from a
measurement of an output signal output by the circuit under test. The circuit under testmay be formed on a semiconductor chip. The circuit under test may correct a signal inputto the semiconductor chip, and outputs the corrected signal. The semiconductor chipmay further include a sampling circuit that samples the output signal of the circuit undertest at the frequency of the carrier signal.
申请人：Masahiro Ishida,Kenichi Nagatani
地址：Gunma JP,Gunma JP
国籍：JP,JP
代理机构：Jianq Chyun IP Office
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