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专利名称：Eddy current testing probe and eddy
current testing method
发明人：Masaaki Kurokawa,Tomonori Shichida申请号：US14179225申请日：20140212公开号：US09903838B2公开日：20180227
专利附图：
摘要：An eddy current testing probe includes: exciter coils including a first exciter coiland a second exciter coil identical with each other and arranged in point symmetry, andeach of which generates an alternating magnetic field to generate an eddy current in a
test object; and detector coils including a first detector coil and a second detector coilidentical with each other, arranged in point symmetry, arranged in phase, anddifferentially connected to each other. The exciter coils and the detector coils arearranged on a single plane. A center of symmetry O on a center line of symmetry CL ofthe coils , is identical with a center of symmetry O on a center line of symmetry CL of thecoils , and the CL intersects with the CL at a right angle.
申请人：MITSUBISHI HEAVY INDUSTRIES, LTD.
地址：Tokyo JP
国籍：JP
代理机构：Westerman, Hattori, Daniels & Adrian, LLP
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